acquire skills
execution and analysis
Data from experiments in physics
of matter.
teacher profile teaching materials
Programme
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.Core Documentation
No reference texts are provided. teacher profile teaching materials
Programme
For programs and textbooks please refer to the lecturer of the course.Core Documentation
For programs and textbooks please refer to the lecturer of the course.