Acquire the theoretical and experimental skills necessary to analyze the morphological, structural and optical properties of materials and their composition. Acquire skills in writing a scientific report.
teacher profile teaching materials
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Programme
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors and at Lasec Laboratory.Core Documentation
- Notes provided by the teacher based on the slides presented during the lectures- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Type of delivery of the course
Theory lectrures in classroom and hands on training in laboratoryAttendance
Attendance at theory lessons is strongly recommended. Attendance of laboratory exercises is mandatoryType of evaluation
final oral examination and evaluation of the lab book teacher profile teaching materials
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Programme
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.Core Documentation
- Notes provided by the teacher based on the slides presented during the lectures- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Type of delivery of the course
Theory lectrures in classroom and hands on training in laboratoryType of evaluation
final oral examination and evaluation of the lab book teacher profile teaching materials
- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Programme
In this course we shall introduce two experimental techniques used to characterize the surface properties of condensed matter: x-ray photoemission spectroscopy (XPS) and atomic force microscopy (AFM). First, we shall provide a theoretical background of the two techniques. The frontal lectures have the following subjects: optical versus scanning probe microscopy; STM; contact AFM; non-contact AFM; secondary SPM techniques; resolution and artifacts; SPM image analysis; surface and vacuum; fundamental of XPS; three-step model; x-ray sources; electron analyzers; electron detection; XPS data acquisition and analysis. Subsequently, the experimental activity will be carried on using tools available at the Laboratory for Physics and Technology of Semiconductors.Core Documentation
- Notes provided by the teacher based on the slides presented during the lectures- Fundamentals of probe scanning microscopy, V. L. Mironov, NT-MDT
Type of delivery of the course
Theory lectrures in classroom and hands on training in laboratoryType of evaluation
final oral examination and evaluation of the lab book